Tungsten probes used for LED (Light Emitting Diode) wafer testing are specialized probes designed for making electrical contact with LED devices during the testing and inspection processes.
LED wafer testing involves assessing the electrical characteristics, ffality, and quality of individual LED components on a semiconductor wafer before they are packaged into final LED devices. They play a crucial role in facilitating these tests.
Material Composition:
Tungsten: Tungsten is often chosen for probe tips due to its hardness, durability, and resistance to wear. These properties make tungsten probes suitable for making repeated and precise electrical contacts without significant degradation over time.
Probe Types:
Pogo Probes: Pogo probes, which are spring-loaded vertical probes, are commonly used in LED wafer testing. The spring-loaded design ensures reliable electrical contact even when the wafer surface may not be perfectly flat.
Cantilever Probes: Cantilever probes with tungsten tips can be used for LED wafer testing, particularly when precise positioning and contact with fine-pitch LED structures are required.
Features for LED Testing:
Fine Pitch Compatibility: LED structures on wafers often have fine pitches, and tungsten probes with fine tips are suitable for making contact with closely spaced LED elements.
Low Contact Force: LED components can be sensitive, and probes designed with low-contact-force characteristics help prevent damage to the LED structures during testing.
High Electrical Conductivity: Tungsten's high electrical conductivity ensures accurate electrical measurements during LED testing.
Chinatungsten Online is a professional manufacturer of tungsten and molybdenum for nearly thirty years. We can supply various kinds of tungsten needles as per the drawings. Please free feel to contact us when you got the purchasing plans.
